Near-Field IR Orientational Spectroscopy of Silk

Orientational dependence wavertree and london cosmopolitan candle of the IR absorbing amide bands of silk is demonstrated from two orthogonal longitudinal and transverse microtome slices with a thickness of only ∼100 nm.Scanning near-field optical microscopy (SNOM) which preferentially probes orientation perpendicular to the sample’s surface was used.Spatial resolution of the silk−epoxy boundary was ∼100 nm resolution, while the spectra were collected by a ∼10 nm tip.

Ratio of the absorbance of the amide-II C-N at 1512 cm − 1 and otto cap 32-285 amide-I C=O β -sheets at 1628 cm − 1 showed sensitivity of SNOM to the molecular orientation.SNOM characterisation is complimentary to the far-field absorbance which is sensitive to the in-plane polarisation.Volumes with cross sections smaller than 100 nm can be characterised for molecular orientation.

A method of absorbance measurements at four angles of the slice cut orientation, which is equivalent to the four polarisation angles absorbance measurement, is proposed.

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